Cuprous oxide (Cu2O) films have been grown on single-crystal MgO(110) subst
rates by a chemical vapor deposition process in the temperature range 690-7
90 degreesC. X-ray diffraction measurements show that phase-pure, highly or
iented Cu2O films form at these temperatures. The Cu2O films are observed t
o grow by an island-formation mechanism on this substrate. Films grown at 6
90 degreesC uniformly coat the substrate except for micropores between grai
ns. However, at a growth temperature of 790 degreesC, an isolated, three-di
mensional island morphology develops. Using a transmission electron microsc
opy and atomic force microscope, both dome- and hut-shaped islands are obse
rved and are shown to be coherent and epitaxial. The isolated, coherent isl
ands form under high mobility growth conditions where geometric strain rela
xation occurs before misfit dislocation can be introduced. This rare observ
ation for oxides is attributed to the relatively weak bonding of Cu2O, whic
h also has a relatively low melting temperature.