Growth and properties of Sr1-xBaxBi2TaNbO9 materials and thin films

Citation
Ms. Tomar et al., Growth and properties of Sr1-xBaxBi2TaNbO9 materials and thin films, J MATER SCI, 36(16), 2001, pp. 3919-3923
Citations number
19
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
JOURNAL OF MATERIALS SCIENCE
ISSN journal
00222461 → ACNP
Volume
36
Issue
16
Year of publication
2001
Pages
3919 - 3923
Database
ISI
SICI code
0022-2461(200108)36:16<3919:GAPOSM>2.0.ZU;2-T
Abstract
Sr1-xBaxBi2TaNbO9 materials have been synthesized using a chemical solution route. Detailed x-ray diffraction and Raman spectroscopic studies indicate s the formation of complete solid solutions for all compositions (x = 0.0 t o 1.00) in Sr1-xBaxBi2TaNbO9. Thin films were deposited by spin coating. Op tical transmission of the film deposited on quartz disk showed the typical interference effect of optical thin films. Ferroelectric polarization on Sr 0.5Ba05Bi2TaNbO9 film deposited on Pt substrate and annealed at 700 degrees C, was measured to be 13.5 muC/cm(2). (C) 2001 Kluwer Academic Publishers.