The effect of impurity cations on the oxygen reduction kinetics at platinum electrodes covered with perfluorinated ionomer

Citation
T. Okada et al., The effect of impurity cations on the oxygen reduction kinetics at platinum electrodes covered with perfluorinated ionomer, J PHYS CH B, 105(29), 2001, pp. 6980-6986
Citations number
21
Categorie Soggetti
Physical Chemistry/Chemical Physics
Journal title
JOURNAL OF PHYSICAL CHEMISTRY B
ISSN journal
15206106 → ACNP
Volume
105
Issue
29
Year of publication
2001
Pages
6980 - 6986
Database
ISI
SICI code
1520-6106(20010726)105:29<6980:TEOICO>2.0.ZU;2-6
Abstract
The mechanism of how impurity cations suppress the kinetics of oxygen reduc tion reaction on platinum surface covered with perfluoro-sulfonated ionomer film was studied in 0.1 N H2SO4 in the presence of various kinds of impuri ty ions of several concentrations. Impurity cations tested were Li+, Na+, K +, Ca2+, Fe3+, Ni2+, and Cu2+ with the amount of 0.1%, 1%, and 10% as compa red with H+ in the solution. Platinum disk of a rotating disk electrode was spin-coated with Nafion solution, and after drying the Nafion film-covered platinum was obtained. The electrochemical measurements were performed to evaluate both charge transfer and diffusion kinetics of oxygen reduction at the Nafion film-covered electrode. It was discovered that the impurity ion s hindered enormously the rate of charge-transfer step at platinum covered with perfluoro-sulfonated ionomer. The suppression started already at 0.1% level of impurity concentration, but did not increase much at over 1% level . No suppression effect for oxygen reduction was observed for a bare platin um in the solution containing impurity ions, indicating that the effect is specific to the metal electrode-ionomer membrane interface. Also both the d iffusion coefficient of oxygen and oxygen concentration in the membrane dec reased by the presence of impurity cations. It was implied that all the pro cess is related to the reorientation of polymer networks in the membrane, w hich might bring about the modification of electric double layer at the pla tinum-ionomer interface.