Emission from the charge transfer state of xanthene dye-sensitized TiO2 nanoparticles: A new approach to determining back electron transfer rate and verifying the marcus inverted regime

Citation
G. Ramakrishna et Hn. Ghosh, Emission from the charge transfer state of xanthene dye-sensitized TiO2 nanoparticles: A new approach to determining back electron transfer rate and verifying the marcus inverted regime, J PHYS CH B, 105(29), 2001, pp. 7000-7008
Citations number
53
Categorie Soggetti
Physical Chemistry/Chemical Physics
Journal title
JOURNAL OF PHYSICAL CHEMISTRY B
ISSN journal
15206106 → ACNP
Volume
105
Issue
29
Year of publication
2001
Pages
7000 - 7008
Database
ISI
SICI code
1520-6106(20010726)105:29<7000:EFTCTS>2.0.ZU;2-W
Abstract
Electron injection and back electron transfer dynamics of xanthene dyes ads orbed on TiO2 nanoparticles have been studied by picosecond transient absor ption and time-resolved fluorescence spectroscopy. When the xanthene dyes a re adsorbed on the TiO2 surface, a good fraction of the dye molecules forms charge transfer (CT) complex with the TiO2 nanoparticle. On excitation of the above system, electron transfer from dye molecule to nanoparticle takes place. Electron injection has been observed by direct detection of electro n in the conduction band of nanoparticle and bleach of the dye as detected by picosecond transient absorption spectroscopy. The corresponding dynamics have been determined by monitoring the recovery kinetics of the bleach of the dye in the visible region. Electron injection in the above systems can take place in two different ways: (1) through the excited state of the dye and (2) through direct injection to the conduction band on excitation of th e charge transfer complex. For the charge transfer complex, when the recomb ination reaction takes place, charge transfer (CT) emission has been observ ed, Monitoring the CT emission, we have determined the back ET rate. We hav e also found that the back ET rate for the xanthene dye-sensitized TiO2 CT complex decreases as the relative driving force increases. Assuming a negli gible change in electronic coupling, our results provide the evidence for t he Marcus inverted region kinetic behavior for an interfacial ET process.