SiO2 coatings containing cobalt were prepared using the sol-gel method and
the Si to Co nominal atomic ratio in the coatings was varied from 1.3 to 7.
1. The structure and optical properties of the coatings, heat-treated in ai
r at 300 and 500 degreesC, were characterized using optical, x-ray diffract
ion, and Auger depth profile measurements. The optical transmission data in
the UV-visible range, in samples with low cobalt concentrations, show only
the absorption bands associated with the tetragonal Co2+ regardless of the
heat treatment temperature. Coatings with a larger amount of Co treated at
300 degreesC show absorption bands associated with both tetragonal and oct
ahedral Co2+. When these coatings are heat treated at 500 degreesC, most of
the cobalt migrates to the free surface of the coatings, where it is oxidi
zed by the atmospheric oxygen and forms a top layer Of Co3O4. The thickness
of the cobalt oxide layer depends on the heat treatment temperature and on
the Co concentration. To describe the absorption bands of both tetragonal
and octahedral Co, the Lorentz oscillator model was used to represent the c
omplex effective dielectric function of the SiO2 cobalt doped layers. The f
requency dependence of the optical constants, in the UV-visible range for t
he top cobalt oxide layer, was obtained with a Jellison-Modine model. (C) 2
001 American Vacuum Society.