Interfacial oxidation, an established approach to produce surface thin film
s for catalysts, corrosion, ware protective coatings and electronic structu
res is currently performed by thermal, anodic, and plasma methods. Fundamen
tal physical-chemical models that can allow film design, particularly on al
loys are lacking and plasma oxidation is the least studied of these methods
. In this work, plasma oxidation of three CuZr alloys (CuZr2, CuZr, and CU5
1Zr14) has been studied using x-ray photoelectron spectroscopy and depth pr
ofiling methods. The dependence of the resulting oxide film on alloy compos
ition and sample temperature during plasma oxidation is investigated. In co
ntrast to thermal and electrochemical oxidation which lead to the formation
of a zirconium oxide film, plasma oxidation leads to the formation of a co
pper oxide or metallic copper overlayer depending on temperature and copper
concentration in the bulk. It is shown that plasma oxidation can be used t
o design oxide films at room temperature, which require high temperatures u
sing thermal oxidation and are not achievable by anodic oxidation. (C) 2001
American Vacuum Society.