In this article the long term stability of Co-Sm thin films, both with no o
vercoat and covered with silicon nitride layers of varying thickness, has b
een investigated by means of accelerated corrosion tests in vacuum, air, an
d in a humidity chamber. Bare Co-Sm films exhibit an accelerated decrease i
n magnetization with respect to reference Co-Pt films, dependent in part on
the effective surface area of the magnetic film. X-ray photoelectron spect
roscopy depth profiling and corrosion tests demonstrate that silicon nitrid
e layers of about 8 nm should provide adequate protection against degradati
on of the magnetic properties of Co-Sm thin films. (C) 2001 American Vacuum
Society.