K. Kawabata et al., High rate sputtering for Ni films by an rf-dc coupled magnetron sputteringsystem with multipolar magnetic plasma confinement, J VAC SCI A, 19(4), 2001, pp. 1438-1441
Ni films were prepared by an rf-dc coupled magnetron sputtering with multip
olar magnetic plasma confinement (MMPC) at the low pressure of 6.7 X 10(-2)
Pa and at the long distance of 120 rum, when permanent magnets were placed
around a nickel target (200 mm phi, 5 mm thick) outside the chamber. When
rf power and dc bias voltages were applied simultaneously to the target, th
e deposition rate of the Ni films significantly increased with the target d
c bias voltage (VT). The highest value of the deposition rate was about 250
nm/min at V-T = -820 V. The high rate sputtering for Ni films was possible
at the low Ar gas pressure of 6.7 x 10(-2) Pa. The resistivity for all the
films deposited at different dc bias voltages was 7.1-8.2 mu Omega cm whos
e value was close to the bulk value. It is shown that the sputtering system
with MMPC has some advantages in comparison with conventional magnetron sp
uttering, such as high deposition rate, plasma discharge stability, and the
preparation of high quality magnetic thin films. (C) 2001 American Vacuum
Society.