Characteristic structures of the Si(111)-7x7 surface step studied by scanning tunneling microscopy

Citation
K. Miyake et al., Characteristic structures of the Si(111)-7x7 surface step studied by scanning tunneling microscopy, J VAC SCI A, 19(4), 2001, pp. 1549-1552
Citations number
19
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS
ISSN journal
07342101 → ACNP
Volume
19
Issue
4
Year of publication
2001
Part
1
Pages
1549 - 1552
Database
ISI
SICI code
0734-2101(200107/08)19:4<1549:CSOTSS>2.0.ZU;2-5
Abstract
Contrary to previous results concluding that all 7 X 7 boundaries in the do wn step edge were complete, 5 X 5 faulted half units were found to be intro duced in part when the transition region was narrow. In addition, the forma tion characteristic of the 5 X 5 faulted half units was strongly influenced by the type of step configuration (nF or nU) and by the structure of the u pper step edge (complete or incomplete). Even when the step configuration w as the same, the difference in the upper step edge structures strongly affe cted introduction of 5 X 5 units. (C) 2001 American Vacuum Society.