K. Miyake et al., Characteristic structures of the Si(111)-7x7 surface step studied by scanning tunneling microscopy, J VAC SCI A, 19(4), 2001, pp. 1549-1552
Contrary to previous results concluding that all 7 X 7 boundaries in the do
wn step edge were complete, 5 X 5 faulted half units were found to be intro
duced in part when the transition region was narrow. In addition, the forma
tion characteristic of the 5 X 5 faulted half units was strongly influenced
by the type of step configuration (nF or nU) and by the structure of the u
pper step edge (complete or incomplete). Even when the step configuration w
as the same, the difference in the upper step edge structures strongly affe
cted introduction of 5 X 5 units. (C) 2001 American Vacuum Society.