M. Wei et al., Formation of Al3Ta by Ta ion implantation into aluminum using a metal vapor vacuum arc ion source, MATER RES B, 36(10), 2001, pp. 1759-1766
The intermetallic compound Al3Ta was directly formed by Ta ion implantation
into aluminum with a current density of 64 muA/cm(2) using a metal vapor v
acuum arc ion source at a dose of 3 X 10(17) ions/cm(2). With increasing Ta
ion dose, the content of the Al3Ta phase increased. At a dose of 7 X 10(17
) ions/cm(2), the Ta-aluminide layer was about 350 nm thick. The aluminide
layer played a significant role in enhancing the surface hardness of the Al
matrix. (C) 2001 Elsevier Science Ltd. All rights reserved.