Preparation and X-ray characterization of low-temperature phases of R2SiO5(R = rare earth elements)

Authors
Wang, JG Tian, SJ Li, GB Liao, FH Jing, XP
Citation
Jg. Wang et al., Preparation and X-ray characterization of low-temperature phases of R2SiO5(R = rare earth elements), MATER RES B, 36(10), 2001, pp. 1855-1861
Citations number
11
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
MATERIALS RESEARCH BULLETIN
ISSN journal
00255408 → ACNP
Volume
36
Issue
10
Year of publication
2001
Pages
1855 - 1861
Database
ISI
SICI code
0025-5408(20010901)36:10<1855:PAXCOL>2.0.ZU;2-M
Abstract
Low-temperature phases of R2SiO5 (R = Y, Tb, Dy, Ho, Er, Tm, and Yb) were s ynthesized by the sol-gel method. The X-ray powder diffraction patterns for these new phases were indexed with the monoclinic unit cell, arid the unit cell parameters were refined. The structure of Y2SiO5 with the space group P2(1)/c was determined by powder diffraction data. (C) 2001 Elsevier Scien ce Ltd. All rights reserved.