Quick derivation of high-power thermal resistance values of HBTs using an existing measurement technique and a theoretical formula

Authors
Tan, CL Hui, P Yan, BP Wang, H Zheng, HQ Yang, H Radhakrishnan, K
Citation
Cl. Tan et al., Quick derivation of high-power thermal resistance values of HBTs using an existing measurement technique and a theoretical formula, MICROW OPT, 30(4), 2001, pp. 287-289
Citations number
10
Categorie Soggetti
Optics & Acoustics
Journal title
MICROWAVE AND OPTICAL TECHNOLOGY LETTERS
ISSN journal
08952477 → ACNP
Volume
30
Issue
4
Year of publication
2001
Pages
287 - 289
Database
ISI
SICI code
0895-2477(20010820)30:4<287:QDOHTR>2.0.ZU;2-M
Abstract
A method is presented for the quick derivation of high-power thermal resist ance values using an existing measurement technique and a theoretical formu la. It first derives the low-power thermal resistance value, and then subst itutes this value into the general form for the dependence of thermal resis tance derived using the Kirchhoff transformation. (C) 2001 John Wiley & Son s, Inc.