We present results of pulsed Raman and phonon-induced luminescence experime
nts on a mixed amorphous-nanocrystalline silicon system (a-nc-Si:H). With t
hese experiments, the decay and transport of nonequilibrium phonons in a-nc
-Si:H was examined and compared with the behavior of phonons of the same fr
equencies in a-Si:H and c-Si. From the Raman measurements. we find that in
the spectral region of the TO vibrations in the crystallites (505-520 cm(-1
)), phonons have shorter decay times than the TO phonons in a-Si:H, but lon
ger than in c-Si. In addition. the lifetimes increase with decreasing frequ
ency, from less than 10 ns at 515 cm(-1) to similar to 30 ns at 505 cm(-1).
We further show that phonons with a frequency of similar to 150 cm(-1) in
a-nc-Si:H have longer lifetimes than in a-Si:H (tau <10 ns). Finally, the d
iffusion of 29-cm(-1) phonons through the a-nc-Si:H and a-Si:H material was
examined in phonon-induced luminescence experiments. Transport through the
a-nc-Si:H film appears to be much slower than through the a-Si:H layer. We
explain these results as effects of phonon confinement. and relate them to
the extremely long phonon lifetimes found in Raman experiments on a-Si(:H)
.