Interface profiles and in-plane anisotropy in common anion type-I Cd1-xMgxTe/CdTe/Cd1-xMnxTe heterostructures studied by reflectivity - art. no. 045312

Citation
A. Kudelski et al., Interface profiles and in-plane anisotropy in common anion type-I Cd1-xMgxTe/CdTe/Cd1-xMnxTe heterostructures studied by reflectivity - art. no. 045312, PHYS REV B, 6404(4), 2001, pp. 5312
Citations number
11
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
PHYSICAL REVIEW B
ISSN journal
01631829 → ACNP
Volume
6404
Issue
4
Year of publication
2001
Database
ISI
SICI code
0163-1829(20010715)6404:4<5312:IPAIAI>2.0.ZU;2-C
Abstract
We report on the experimental study of the in-plane optical anisotropy of C dTe-based quantum wells with asymmetric barriers made of (Cd,Mg)Te or (Cd,M n)Te ternary compounds. We observe a significant linear polarization of the fundamental excitonic transitions along the (110) directions. The measured polarization rates are analyzed in the framework of an envelope function t heory incorporating interface symmetry reduction for intermixed composition profiles. Fitting the experimental data produces inter-face anisotropy par ameters that are larger than the ones predicted by a recent microscopic the ory. The analysis shows an important influence of the interface profile asy mmetry on the observed in-plane anisotropy.