Tort solutions for the 3D radiation transport benchmarks for simple geometries with void region

Citation
Yy. Azmy et al., Tort solutions for the 3D radiation transport benchmarks for simple geometries with void region, PROG NUCL E, 39(2), 2001, pp. 155-166
Citations number
4
Categorie Soggetti
Nuclear Emgineering
Journal title
PROGRESS IN NUCLEAR ENERGY
ISSN journal
01491970 → ACNP
Volume
39
Issue
2
Year of publication
2001
Pages
155 - 166
Database
ISI
SICI code
0149-1970(2001)39:2<155:TSFT3R>2.0.ZU;2-N
Abstract
We present the solutions for the set of three-dimensional radiation transpo rt Benchmark problems obtained with the TORT transport code using its three optional methods: Theta Weighted (OW), Linear Nodal (LN), and Linear Chara cteristic (LC). Only the cases with 50% scattering are presented in this pa per since the nonscattering cases are bound to suffer severe ray effects. B y solving the problems on a sequence of refined meshes we illustrate that f or some points defined in the benchmark the solution converges with mesh re finement. However, the solution at most points does not converge with mesh refinement, and we illustrate that this is a consequence of ray effects in the void region. Also, we compare TORT's solutions to the Monte Carlo refer ence solution and observe that even when TORT's solution converges with mes h refinement, it usually does not converge to the Monte Carlo reference. Th is behavior also results from ray effects, and therefore we conjecture it w ill appear in varying degrees in all discrete ordinates accurate solutions because ray effects exist in the exact solution of the discrete ordinates e quations. While this result is disappointing from the benchmarking point of view, it bodes well for TORT's ability to produce highly accurate solution s to the discrete ordinates approximation. Eliminating ray effects requires extensions of the solution algorithm, e.g. via a first collision source, w hile preserving the desirable features of the discrete ordinates methodolog y. (C) 2001 Elsevier Science Ltd. All rights reserved.