R. Banerjee et al., Influence of crystallographic orientation and layer thickness on fracture behavior of Ni/Ni3Al multilayered thin films, SCR MATER, 44(11), 2001, pp. 2629-2633
Ni / Ni3Al multilayers have been deposited epitaxially and non-epitaxially
by UHV magnetron sputtering on < 001 > NaCl substrates. Two interfacial ori
entations were achieved: {001} Ni // {001} Ni3Al, < 100 > Ni // < 100 > Ni3
Al and {111} Ni // {111} Ni3Al, < 110 > Ni // < 110 > Ni3Al Under in-plane
tensile loading, < 001 >, oriented multilayers exhibit ductile fracture sur
face features but < 111 > oriented multilayers of the same layer thickness
are predominantly brittle. For each orientation, the fracture surface featu
res from 20 nm thick Ni and Ni3Al layers appear to be as ductile or more du
ctile than those from 120 nm thick layers, but the plastic deformation appe
ars to be more localized. (C) 2001 Acta Materialia Inc. Published by Elsevi
er Science Ltd. All rights reserved.