In this paper it is reported a special technological solution to improve th
e performance and to simplify the fabrication process of the miniaturized m
agnetostrictive delay line (MDL) obtained by thin films technology. In orde
r to increase the sensitivity level without adding new difficulties in the
reliability of the sensing element, we conceived and realized a new configu
ration of miniaturized MDL using a magnetoresistive sensing three-layered s
tructure. According to this configuration, MDL arrangement can be miniaturi
zed, without the use of the receiving coil fabricated by thin film technolo
gy and photolithographic techniques, allowing thus a simple fabrication pro
cess and a high output signal level. (C) 2001 Elsevier Science B.V. All rig
hts reserved.