Indium monosulfide (InS) thin films were prepared by thermal evaporation on
to quartz and glass substrates held at 473 K during the deposition process.
The structural investigations showed that the obtained films have an amorp
hous nature. Energy dispersion X-ray spectroscopy analysis showed that they
are stoichiometric. The optical constants, the electrical resistivity, as
well as the space charge limited currents were studied. The obtained result
s indicate that InS thin films have nondirect allowed optical transitions w
ith an energy gap of 1.94eV. The thermal activation energy of the charge ca
rriers from the electrical resistivity measurements was found to be 0.84eV,
which was confirmed by the space charge limited current technique. The tra
p density N-t was found to be 5.88 x 10(21) m(-3). (C) 2001 Elsevier Scienc
e Ltd. All rights reserved.