Visualization of 3D-SIMS measurements

Authors
Hutter, H Nowikow, K Gammer, K
Citation
H. Hutter et al., Visualization of 3D-SIMS measurements, APPL SURF S, 179(1-4), 2001, pp. 161-166
Citations number
14
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
APPLIED SURFACE SCIENCE
ISSN journal
01694332 → ACNP
Volume
179
Issue
1-4
Year of publication
2001
Pages
161 - 166
Database
ISI
SICI code
0169-4332(20010716)179:1-4<161:VO3M>2.0.ZU;2-S
Abstract
Secondary ion mass spectroscopy (SIMS) provides a method to examine the 3D distribution of chemical elements in solids. We created a software program (Visualizer) for the visualization of SIMS 3D data using the visualization toolkit (VTK), a free C++ class library for 3D graphics. Furthermore, we us ed fusion in order to obtain one single image from several 3D images, each showing the 3D distribution of one chemical element within the sample. (C) 2001 Published by Elsevier Science B.V.