Wr. Humbert et Wr. Scott, MEASUREMENT OF THE PERMITTIVITY AND LOSS TANGENT OF DIELECTRIC SHEETS, Microwave and optical technology letters, 15(6), 1997, pp. 355-358
A previously introduced resonant measurement technique is extended to
include dielectric sheets. The technique is not limited by the sheet's
thickness or dielectric constant because it involves a full-wave anal
ysis of the fixture. A method to account for conduction loss doe to th
e surface resistance of the metal walls of the fixture is presented. E
xperimental results are presented and compared to previously reported
values, and are in excellent agreement. (C) 1997 John Wiley & Sons, In
c.