A deterministic nonlinear-capacitor model for single-electron tunneling junctions

Citation
M. Hanggi et Lo. Chua, A deterministic nonlinear-capacitor model for single-electron tunneling junctions, IEEE CIRC-I, 48(8), 2001, pp. 1019-1022
Citations number
5
Categorie Soggetti
Eletrical & Eletronics Engineeing
Journal title
IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS I-FUNDAMENTAL THEORY AND APPLICATIONS
ISSN journal
10577122 → ACNP
Volume
48
Issue
8
Year of publication
2001
Pages
1019 - 1022
Database
ISI
SICI code
1057-7122(200108)48:8<1019:ADNMFS>2.0.ZU;2-Y
Abstract
Single-electron tunneling junctions (SETJs) have intriguing properties whic h make them a primary nanoelectronic device for highly compact, fast, and l ow-power circuits. However, standard models for SETJs are based on a quantu m mechanical approach which is very impractical for the analysis and design of SETJ-based circuitry, where a simple, preferably deterministic model is a prerequisite. We verify by physics-based Monte Carlo simulations that th e tunneling junction can in fact be modeled by a piecewise linear voltage-c harge relation, which, from the circuit-theoretic perspective, is a nonline ar capacitor.