Y. Hu et al., A low-noise, low-power CMOS SOI readout front-end for silicon detectors leakage current compensation with capability, IEEE CIRC-I, 48(8), 2001, pp. 1022-1030
Citations number
10
Categorie Soggetti
Eletrical & Eletronics Engineeing
Journal title
IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS I-FUNDAMENTAL THEORY AND APPLICATIONS
A low-noise, low-power CMOS semiconductor on insulator (SOI) readout front-
end aiming to dc coupling to silicon radiation detectors is presented in th
is paper. It is able to compensate the leakage current of detectors within
a wide range up to 10 muA. While the presented solution does not significan
tly deteriorate the amplifier noise performance it complies with demands fo
r low-noise readout system for silicon detectors. This front-end system inc
ludes a charge-sensitive amplifier, a semi-Gaussian CR-RC shaping amplifier
and an output buffer. It has been simulated and implemented in a CMOS SOI-
SIMOX process. For no leakage current, an input referred equivalent noise c
harge (ENC) of 426 electrons (rms) for 0 pF of detector capacitance with a
noise slope of 40 electrons/pF, a peaking time of 50 ns, and a conversion g
ain of 23.4 mV/fC have been obtained.