Na. Kotov et al., MECHANISM OF AND DEFECT FORMATION IN THE SELF-ASSEMBLY OF POLYMERIC POLYCATION-MONTMORILLONITE ULTRATHIN FILMS, Journal of the American Chemical Society, 119(29), 1997, pp. 6821-6832
Positively charged polydiallyldimethylammonium chloride, P, was found
to bind strongly to the surface of anionic montmorrillonite, M, platel
ets in aqueous dispersions up to a saturation (estimated to correspond
to the binding of five P to one 1.0 nn x 200 nm M platelet) beyond wh
ich reversible physisorption occurred. Immersion of a substrate (glass
, quartz, silica-wafer, gold, silver,and even Teflon) into an aqueous
1% solution of P and rinsing with ultrapure water for 10 min resulted
in the strong adsorption of a 1.6 nm thick P on the substrate. Immersi
on of the P coated substrate into an aqueous dispersion of M and rinsi
ng with ultrapure water for 10 min led to the adsorption of 2.5 nm thi
ck M. Repeating the self-assembly steps of P and M for n number of tim
es produced (P/M)(n) self-assembled films. Thickness of the M layer wa
s found to depend on the external voltage applied during its self-asse
mbly: applying a positive potential during the self-assembly of M incr
eased the thickness of the M layer; application of a small negative po
tential decreased it slightly; however, larger negative voltages augme
nted it. The structure of self-assembled (P/M)(n), films have been cha
racterized by a variety of techniques: X-ray diffraction, X-ray reflec
tivity, atomic force microscopy, transmission electron microscopic, an
d surface plasmon spectroscopic measurements. It was shown that clay p
latelets form stacks upon adsorption to the polymer layer consisting o
n the average two aluminosilicate sheets. The evolution of the surface
roughness upon sequential deposition of P/M layers was observed by in
situ AFM. Large etched pits, up to 700 nm diameter and 30 nm depth, w
ere smoothed during P/M deposition. Small pits (188 nm diameter and 14
nm deep) were capped after one P/M deposition cycle. Surface roughnes
s of (P/M)(n) films was estimated by a number of methods including sur
face plasmon spectroscopy. The overall roughness did not appear to cor
relate with the type of substrate used. On the other hand, application
of an external electric field during the self-assembly of P strongly
influenced the surface morphology. Application of a negative potential
during the self-assembly of P improved the uniformity and regularity
of the deposited layers.