Free-electron laser etching of dental enamel

Citation
Ej. Swift et al., Free-electron laser etching of dental enamel, J DENT, 29(5), 2001, pp. 347-353
Citations number
36
Categorie Soggetti
Dentistry/Oral Surgery & Medicine
Journal title
JOURNAL OF DENTISTRY
ISSN journal
03005712 → ACNP
Volume
29
Issue
5
Year of publication
2001
Pages
347 - 353
Database
ISI
SICI code
0300-5712(200107)29:5<347:FLEODE>2.0.ZU;2-1
Abstract
Objective: The purpose of this study was to evaluate the Mark-III free-elec tron laser as a means of etching enamel surfaces, with potential applicatio n to resin bonding. Methods: The FEL was tuned to wavelengths ranging from 3.0 to 9.2 mum. Spec ific wavelengths that are resonantly absorbed by phosphates, proteins, and water were used. First, bovine enamel was polished and exposed to static FE L exposures. Lased enamel was examined using scanning electron microscopy ( SEM). Additional bovine enamel specimens were exposed to FEL at similar wav elengths, but with rastering to create treated rectangular areas on each sp ecimen. Surface roughness was evaluated using profilometry and atomic force microscopy (AFM). Composite was bonded to the lased enamel, and shear bond strengths were determined using an Instron universal testing machine. As a control, the surface roughness of, and shear bond strengths to, acid-etche d enamel were determined. Results: Static FEL exposures caused changes in the enamel ranging from an etched appearance to pits, cracks, and frank cratering. The surface roughne ss of lased enamel was much greater than that of acid-etched enamel, and wa s qualitatively different as well. Shear bond strengths of resin to acid-et ched enamel were significantly higher than bond strengths to lased enamel. Conclusions: Under the conditions used in this study, the FEL did not offer a practical and effective method of etching enamel for resin bonding. Howe ver, the ability of the FEL to deliver many specific wavelengths makes it a n interesting tool for further research of laser effects on tooth structure . (C) 2001 Elsevier Science Ltd. All rights reserved.