K. Asakura et K. Ijima, Polarization-dependent EXAFS studies on the structures of Mo oxides dispersed on single crystals, J ELEC SPEC, 119(2-3), 2001, pp. 185-192
Citations number
38
Categorie Soggetti
Spectroscopy /Instrumentation/Analytical Sciences
Journal title
JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA
Polarization dependent total reflection fluorescence extended X-ray absorpt
ion fine structure (PTRF-EXAFS) is reviewed briefly. This technique gives 3
-dimensional information about the local structure around the X-ray absorbi
ng atom even if the atom is highly-dispersed on the surface. We have applie
d the technique to the Mo oxide species dispersed on single crystal oxide s
urfaces, such as Al2O3(0001), MgO(100) and TiO2(110). Tetrahedral Mo specie
s is found on MgO(100) surface while tetragonal pyramid species and octahed
ral dimer Mo species are found on Al2O3 and TiO2 surfaces, respectively. Th
e structure dependences on support can be explained by the acidity and basi
city of the support oxides. (C) 2001 Elsevier Science B.V. All rights reser
ved.