Polarization-dependent EXAFS studies on the structures of Mo oxides dispersed on single crystals

Citation
K. Asakura et K. Ijima, Polarization-dependent EXAFS studies on the structures of Mo oxides dispersed on single crystals, J ELEC SPEC, 119(2-3), 2001, pp. 185-192
Citations number
38
Categorie Soggetti
Spectroscopy /Instrumentation/Analytical Sciences
Journal title
JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA
ISSN journal
03682048 → ACNP
Volume
119
Issue
2-3
Year of publication
2001
Pages
185 - 192
Database
ISI
SICI code
0368-2048(200108)119:2-3<185:PESOTS>2.0.ZU;2-1
Abstract
Polarization dependent total reflection fluorescence extended X-ray absorpt ion fine structure (PTRF-EXAFS) is reviewed briefly. This technique gives 3 -dimensional information about the local structure around the X-ray absorbi ng atom even if the atom is highly-dispersed on the surface. We have applie d the technique to the Mo oxide species dispersed on single crystal oxide s urfaces, such as Al2O3(0001), MgO(100) and TiO2(110). Tetrahedral Mo specie s is found on MgO(100) surface while tetragonal pyramid species and octahed ral dimer Mo species are found on Al2O3 and TiO2 surfaces, respectively. Th e structure dependences on support can be explained by the acidity and basi city of the support oxides. (C) 2001 Elsevier Science B.V. All rights reser ved.