Site-selective XAFS spectroscopy tuned to surface active sites of copper catalysts

Citation
Y. Izumi et al., Site-selective XAFS spectroscopy tuned to surface active sites of copper catalysts, J ELEC SPEC, 119(2-3), 2001, pp. 193-199
Citations number
11
Categorie Soggetti
Spectroscopy /Instrumentation/Analytical Sciences
Journal title
JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA
ISSN journal
03682048 → ACNP
Volume
119
Issue
2-3
Year of publication
2001
Pages
193 - 199
Database
ISI
SICI code
0368-2048(200108)119:2-3<193:SXSTTS>2.0.ZU;2-#
Abstract
To overcome the problem of X-ray absorption fine structure (XAFS) spectrosc opy in which the obtained information is the average for all sites in sampl e, Rowland-type fluorescence spectrometer was designed to measure site-sele ctive XAFS spectra by utilizing the chemical shift of emission peak for eac h site. Johansson-type cylindrically-bent Ge(111) crystal and scintillation counter were mounted on the spectrometer. The improvement of energy resolu tion of spectrometer was discussed when the primary beam size and two slit size in the Rowland circle were varied. The energy resolution was similar t o1.1 eV, smaller than the core-hole lifetime width for Cu K alpha (1) (2.11 eV). The site selection of the Cu-0 and Cu-1 site-tune spectra was experim entally measured for the physical mixture of Cu metal+Cul and for Cu/ZnO ca talyst. Obtained experimental site selection was compared to the theoretica l estimations. (C) 2001 Elsevier Science B.V. All rights reserved.