X-ray excited optical luminescence (XEOL) studies of CaF2 at the Ca L-3,L-2-edge

Citation
Sj. Naftel et al., X-ray excited optical luminescence (XEOL) studies of CaF2 at the Ca L-3,L-2-edge, J ELEC SPEC, 119(2-3), 2001, pp. 215-220
Citations number
24
Categorie Soggetti
Spectroscopy /Instrumentation/Analytical Sciences
Journal title
JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA
ISSN journal
03682048 → ACNP
Volume
119
Issue
2-3
Year of publication
2001
Pages
215 - 220
Database
ISI
SICI code
0368-2048(200108)119:2-3<215:XEOL(S>2.0.ZU;2-J
Abstract
We report a study of the optical response of CaF2 specimens (crystal and po wder) with excitation photon energy tuned across the Ca L-3.2-edge. The lum inescence was in turn used to monitor the absorption across the Ca L-edge ( optical XAFS). It is found that the photoluminescence yield produces an inv erted spectrum. This observation is interpreted in terms of total absorptio n (thickness effect), the change in decay dynamics below and above the edge and the atomic origin of the luminescence. By comparing crystal and powder results, we find that the surface component of CaF2 exhibits a positive sh ift (similar to0.15 eV) relative to the bulk at the p-d resonance at the Ca L-3.2-edge. A DFT calculation has been carried out and it is in good accor d with the experiment. The implications of these results are discussed. (C) 2001 Elsevier Science BY All rights reserved.