XANES studies of CdS nano-structures on porous silicon

Citation
P. Zhang et al., XANES studies of CdS nano-structures on porous silicon, J ELEC SPEC, 119(2-3), 2001, pp. 229-233
Citations number
11
Categorie Soggetti
Spectroscopy /Instrumentation/Analytical Sciences
Journal title
JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA
ISSN journal
03682048 → ACNP
Volume
119
Issue
2-3
Year of publication
2001
Pages
229 - 233
Database
ISI
SICI code
0368-2048(200108)119:2-3<229:XSOCNO>2.0.ZU;2-M
Abstract
US nano-structures were produced electrochemically using porous silicon (PS ) as a template/substrate. AFM and SEM images show that the US deposit are grains of similar to 100 nm, each of which is an aggregate of smaller parti cles of several nanometers. XANES studies of the US nano-structures togethe r with bulk US were conducted. The electronic behavior and optical properti es of the CdS/PS composite, particularly those relevant to nano-size effect s, were discussed. (C) 2001 Elsevier Science BY All rights reserved.