Direct tunnelling models for circuit simulation

Citation
P. O'Sullivan et al., Direct tunnelling models for circuit simulation, MICROEL REL, 41(7), 2001, pp. 951-957
Citations number
30
Categorie Soggetti
Eletrical & Eletronics Engineeing
Journal title
MICROELECTRONICS RELIABILITY
ISSN journal
00262714 → ACNP
Volume
41
Issue
7
Year of publication
2001
Pages
951 - 957
Database
ISI
SICI code
0026-2714(200107)41:7<951:DTMFCS>2.0.ZU;2-O
Abstract
This paper presents a review of models for direct tunnelling with a view to identifying suitable models for inclusion in a circuit simulator. For thin oxides, the critical quantities required for the derivation of tunnel curr ent are the transparency of the barrier, the oxide field and the supply of carriers for tunnelling. This paper reviews different approaches to the inc orporation of these quantities in analytical models. A new model for direct tunnelling, which includes quantum effects in a format suitable for circui t simulation, is outlined. Recent developments in MOSFET models, which incl ude gate current, are briefly discussed. (C) 2001 Elsevier Science Ltd. All rights reserved.