This paper presents a review of models for direct tunnelling with a view to
identifying suitable models for inclusion in a circuit simulator. For thin
oxides, the critical quantities required for the derivation of tunnel curr
ent are the transparency of the barrier, the oxide field and the supply of
carriers for tunnelling. This paper reviews different approaches to the inc
orporation of these quantities in analytical models. A new model for direct
tunnelling, which includes quantum effects in a format suitable for circui
t simulation, is outlined. Recent developments in MOSFET models, which incl
ude gate current, are briefly discussed. (C) 2001 Elsevier Science Ltd. All
rights reserved.