Wear-out, breakdown occurrence and failure detection in 18-25 angstrom ultrathin oxides

Citation
F. Monsieur et al., Wear-out, breakdown occurrence and failure detection in 18-25 angstrom ultrathin oxides, MICROEL REL, 41(7), 2001, pp. 1035-1039
Citations number
12
Categorie Soggetti
Eletrical & Eletronics Engineeing
Journal title
MICROELECTRONICS RELIABILITY
ISSN journal
00262714 → ACNP
Volume
41
Issue
7
Year of publication
2001
Pages
1035 - 1039
Database
ISI
SICI code
0026-2714(200107)41:7<1035:WBOAFD>2.0.ZU;2-5
Abstract
In this paper, a comprehensive description of the ultrathin oxide failure e volution is presented. For sub-25 Angstrom, Hard BD is no longer hard. A co mplete description of the novel failure manifestation (progressive breakdow n) is done. Associated wear-out is modelled and a physical mechanism is pro posed. Finally, the relevance of the failure definition is discussed. It is a crucial point, to adopt a rigorous methodology for reliability predictio n. It is concluded that, in the case of progressive breakdown, noise occurr ence must be considered as the relevant time to failure. (C) 2001 Elsevier Science Ltd. All rights reserved.