Technique for detecting changes in fluorescence lifetime by means of optoelectronic circuit auto-oscillation

Citation
Mj. O'Brien et al., Technique for detecting changes in fluorescence lifetime by means of optoelectronic circuit auto-oscillation, OPTICS LETT, 26(16), 2001, pp. 1256-1258
Citations number
10
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Optics & Acoustics
Journal title
OPTICS LETTERS
ISSN journal
01469592 → ACNP
Volume
26
Issue
16
Year of publication
2001
Pages
1256 - 1258
Database
ISI
SICI code
0146-9592(20010815)26:16<1256:TFDCIF>2.0.ZU;2-M
Abstract
We present a new, simple, inexpensive, and highly precise approach to excit ed-state fluorescence-lifetime-based measurements. The detection system con sists of a closed-loop optoelectronic arrangement containing a radio freque ncy resonance amplifier, a fluorescence excitation light source, a fiber-op tic delay line, and a photodetector. The system exhibits auto-oscillations in the form of intensity modulation. The oscillation frequency varies with the modulation phase shift of the fluorescent light. This frequency is used as the detection parameter, which is advantageous because frequency may be measured easily, inexpensively, and with high precision. This technique is well suited for chemical or biosensor applications. (C) 2001 Optical Socie ty of America.