High precision mass spectroscopy using highly charged ions in a penning trap

High precision mass measurements are performed at the SMILETRAP facility by measuring the cyclotron frequencies of ions trapped in the electric and ma gnetic fields of a Penning trap. Since the resolving power increases linear ly with the ion charge state, the SMILETRAP experiment is connected to an E lectron Beam Ion Source (EBIS). Using this technique we have shown that we are able to measure routinely the mass of any stable element within 1 ppb a ccuracy, Examples of some of the recent mass measurements and their possibl e applications for various fields of atomic and nuclear physics are given.