Photoelectron diffraction study on Ge(100) 3d core level

The 3d core level of Ge(1 0 0)-c(4 x 2) surface has been measured by high r esolution photoemission at 100 K. The line shape presents several features. The analysis of the Ge 3d core levels unambiguously reveals for the first time the presence of four surface components analogous to the surface compo nents in Si(1 0 0)-c(4 x 2) 2p core level. In order to associate the surfac e core level components to their corresponding atomic sites we have perform ed azimuthal Ge 3d core level photoelectron diffraction on the Ge(1 0 0) su rface at low kinetic energy. The comparison with multiple scattering calcul ations is shown. (C) 2001 Elsevier Science B.V. All rights reserved.