An X-ray photoelectron diffraction structural characterization of an epitaxial MnO ultrathin film on Pt(111)

An epitaxial ultrathin MnO/Pt(111) film (13 Angstrom thick) has been grown by reactive UHV deposition of Mn-2(CO)(10) on Pt(111) at 200 degreesC in th e presence of water. Angle scanned X-ray photoelectron diffraction (XPD) an d LEED have been used to structurally characterize the film. The observed 1 x 1 LEED pattern is in accord with the bulk lattice paramete r of a MnO(111) surface (3.14 Angstrom) and demonstrates that the film is o rdered in the long range. Full hemispherical Ols and Mn2p XPD plots have be en obtained and analysed on the basis of multiple scattering calculations. The XPD data confirm that the MnO(111) surface (as a single domain) is expo sed and a best fit procedure based on a R-factor analysis provides a direct evidence for a relaxation of the outermost double layer, whose values are similar to those found in other similar systems (COO and FeO). (C) 2001 Els evier Science B.V. All rights reserved.