Surface conductance of Si(100)2 x 1 and Si(111)7 x 7

Citation
K. Yoo et Hh. Weitering, Surface conductance of Si(100)2 x 1 and Si(111)7 x 7, SURF SCI, 482, 2001, pp. 482-487
Citations number
25
Categorie Soggetti
Physical Chemistry/Chemical Physics
Journal title
SURFACE SCIENCE
ISSN journal
00396028 → ACNP
Volume
482
Year of publication
2001
Part
1
Pages
482 - 487
Database
ISI
SICI code
0039-6028(20010620)482:<482:SCOSX1>2.0.ZU;2-8
Abstract
The surface conductance of Si(1 0 0)2 x 1 and Si(1 1 1)7 x 7 was measured a s a function of temperature on a fully-depleted Si/SiO2/Si substrate. The s urface conductance of Si(1 0 0)2 x 1 shows a clear signature of the c(4 x 2 ) --> 2 x 1 order-disorder surface phase transition near 200 K. The surface conductance of Si(1 1 1)7 x 7 increases dramatically after passivation wit h molecular oxygen. This phenomenon is not yet understood. (C) 2001 Elsevie r Science B.V. All rights reserved.