Will metrological gaps develop into TBTs?

Authors
De Bievre, P
Citation
P. De Bievre, Will metrological gaps develop into TBTs?, ACCRED Q A, 6(8), 2001, pp. 339-339
Categorie Soggetti
Spectroscopy /Instrumentation/Analytical Sciences
Journal title
ACCREDITATION AND QUALITY ASSURANCE
ISSN journal
09491775 → ACNP
Volume
6
Issue
8
Year of publication
2001
Pages
339 - 339
Database
ISI
SICI code
0949-1775(200108)6:8<339:WMGDIT>2.0.ZU;2-I