The structure of the interface between BaTiO3 thin films and MgO substrates

Citation
Cl. Jia et al., The structure of the interface between BaTiO3 thin films and MgO substrates, ACT MATER, 49(14), 2001, pp. 2783-2789
Citations number
13
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
ACTA MATERIALIA
ISSN journal
13596454 → ACNP
Volume
49
Issue
14
Year of publication
2001
Pages
2783 - 2789
Database
ISI
SICI code
1359-6454(20010816)49:14<2783:TSOTIB>2.0.ZU;2-R
Abstract
The interface structure and interfacial defects in BaTiO3 films deposited b y laser ablation on MgO (001) substrates were investigated by means of high -resolution transmission electron microscopy. Two types of structure for th e (001) interface, a TiO2 plane or a BaO plane of BaTiO3 facing a MgO plane , were observed. The structure of TiO2/MgO was adopted by the main part of the interface. The occurrence of the BaO/MgO structure was found to be rela ted to the interfacial steps with a height of n - 1/2 (n = 1,2,3,...) unit cells. The positions of the individual atomic species in the interfacial pl anes were clarified by investigation of both [100] and [110] images combine d with image simulation. Based on lattice images along the two directions, the configuration and the Burgers vectors of interfacial dislocations were determined. The coexistence of different types of interface structure and d islocations was discussed on the basis of geometrical models of the interfa ce structure and film growth. (C) 2001 Acta Materialia Inc. Published by El sevier Science Ltd. All rights reserved.