High-pressure x-ray diffraction of icosahedral Zr-Al-Ni-Cu-Ag quasicrystals

Citation
Jz. Jiang et al., High-pressure x-ray diffraction of icosahedral Zr-Al-Ni-Cu-Ag quasicrystals, APPL PHYS L, 79(8), 2001, pp. 1112-1114
Citations number
41
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
APPLIED PHYSICS LETTERS
ISSN journal
00036951 → ACNP
Volume
79
Issue
8
Year of publication
2001
Pages
1112 - 1114
Database
ISI
SICI code
0003-6951(20010820)79:8<1112:HXDOIZ>2.0.ZU;2-E
Abstract
The effect of pressure on the structural stability of icosahedral Zr-Al-Ni- Cu-Ag quasicrystals forming from a Zr65Al7.5Ni10Cu7.5Ag10 metallic glass wi th a supercooled liquid region of 44 K has been investigated by in situ hig h-pressure angle-dispersive x-ray powder diffraction at ambient temperature using synchrotron radiation. The icosahedral quasicrystal structure is ret ained up to the highest hydrostatic pressure used (approximately 28 GPa) an d is reversible after decompression. The bulk modulus at zero pressure and its pressure derivative of the icosahedral Zr-Al-Ni-Cu-Ag quasicrystal are 99.10+/-1.26 GPa and 4.25+/-0.16, respectively. The compression behavior of different Bragg peaks is isotropic and the full width at half maximum of e ach peak remains almost unchanged during compression, indicating no anisotr opic elasticity and no defects in the icosahedral Zr-Al-Ni-Cu-Ag quasicryst als induced by pressure. (C) 2001 American Institute of Physics.