Reliability and current carrying capacity of carbon nanotubes

Authors
Wei, BQ Vajtai, R Ajayan, PM
Citation
Bq. Wei et al., Reliability and current carrying capacity of carbon nanotubes, APPL PHYS L, 79(8), 2001, pp. 1172-1174
Citations number
22
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
APPLIED PHYSICS LETTERS
ISSN journal
00036951 → ACNP
Volume
79
Issue
8
Year of publication
2001
Pages
1172 - 1174
Database
ISI
SICI code
0003-6951(20010820)79:8<1172:RACCCO>2.0.ZU;2-K
Abstract
The current-carrying capacity and reliability studies of multiwalled carbon nanotubes under high current densities (> 10(9) A/cm(2)) show that no obse rvable failure in the nanotube structure and no measurable change in the re sistance are detected at temperatures up to 250 degreesC and for time scale s up to 2 weeks. Our results suggest that nanotubes are potential candidate s as interconnects in future large-scale integrated nanoelectronic devices. (C) 2001 American Institute of Physics.