Conducting-atomic force microscopy investigation of the local electrical characteristics of a Ti/TiO2/Pt anode

Authors
Macpherson, JV de Mussy, JPG Delplancke, JL
Citation
Jv. Macpherson et al., Conducting-atomic force microscopy investigation of the local electrical characteristics of a Ti/TiO2/Pt anode, EL SOLID ST, 4(9), 2001, pp. E33-E36
Citations number
27
Categorie Soggetti
Physical Chemistry/Chemical Physics
Journal title
ELECTROCHEMICAL AND SOLID STATE LETTERS
ISSN journal
10990062 → ACNP
Volume
4
Issue
9
Year of publication
2001
Pages
E33 - E36
Database
ISI
SICI code
1099-0062(200109)4:9<E33:CFMIOT>2.0.ZU;2-D
Abstract
Pt microwire atomic force microscope (AFM) probes have been employed to cha racterize the electrical and topographical properties of a Ti/TiO2/Pt anode . The anode consisted of supported Pt metal microparticles in a porous Ti/T iO2 film. Pt microwire probes were found to be more reliable than Pt-coated Si3N4 tips for conductivity mapping in contact mode. Preliminary results r evealed a marked spatial heterogeneity in the current-voltage characteristi cs of the Pt microdeposits, attributed to the nature of the subsurface Pt c ontact to the underlying Ti/TiO2 substrate. Prospects for using conducting- AFM more widely to characterize the local electrical properties of complex electrode materials are highlighted. (C) 2001 The Electrochemical Society.