In situ surface enhanced raman scattering of ruthenium dioxide films in acid electrolytes

Citation
Yb. Mo et al., In situ surface enhanced raman scattering of ruthenium dioxide films in acid electrolytes, EL SOLID ST, 4(9), 2001, pp. E37-E38
Citations number
11
Categorie Soggetti
Physical Chemistry/Chemical Physics
Journal title
ELECTROCHEMICAL AND SOLID STATE LETTERS
ISSN journal
10990062 → ACNP
Volume
4
Issue
9
Year of publication
2001
Pages
E37 - E38
Database
ISI
SICI code
1099-0062(200109)4:9<E37:ISSERS>2.0.ZU;2-7
Abstract
Vibrational aspects of thin RuO2 films (ca. 7-8 X 10(-8) mol Ru sites/cm(2) ) electrodeposited on preroughened Au electrodes were investigated in situ in 0.50 M H2SO4 aqueous solutions using surface enhanced Raman scattering ( SERS). Prominent peaks could be observed for the material in the predominan tly fully oxidized state (+0.80 V vs. SCE) at 456 and 710 cm(-1), and predo minantly fully reduced state (+0.10 V vs. SCE) at 614 and 750 cm(-1). The f irst set of features is in good agreement with in situ SERS measurements re ported by Chan et al. for oxidized metallic Ru films in acid electrolytes p olarized at high potentials and ascribed by those authors to a hydrated for m of Ru oxide in the 4+ formal oxidation state. Based on our recent in situ Ru K-edge X-ray absorption fine structure of thicker RuO2 films prepared b y the same procedure employed in this work, the peaks observed for the firs t time for the predominantly reduced film are attributed to a highly disord ered oxide incorporating Ru sites in the 3+ oxidation state. (C) 2001 The E lectrochemical Society.