A DFT controller for instruction-based functional test

Authors
Kim, HS Kim, YC Kang, S
Citation
Hs. Kim et al., A DFT controller for instruction-based functional test, IEICE T FUN, E84A(8), 2001, pp. 2070-2072
Citations number
2
Categorie Soggetti
Eletrical & Eletronics Engineeing
Journal title
IEICE TRANSACTIONS ON FUNDAMENTALS OF ELECTRONICS COMMUNICATIONS AND COMPUTER SCIENCES
ISSN journal
09168508 → ACNP
Volume
E84A
Issue
8
Year of publication
2001
Pages
2070 - 2072
Database
ISI
SICI code
0916-8508(200108)E84A:8<2070:ADCFIF>2.0.ZU;2-O
Abstract
This paper presents a DFT controller called as a TCU (Test Control Unit). w hich considerably improves the efficiency of the instruction-based function al test. Internal program/data buses are completely controllable and observ able by the TCU during the test cycle. Diverse test modes of the TCU call i ncrease the test efficiency and also provide complete access to program/dat a memories for functional test.