Wafer bonding of 50-mm-diameter mirror substrates to AlGaInP light-emitting diode wafers

Citation
Rh. Horng et al., Wafer bonding of 50-mm-diameter mirror substrates to AlGaInP light-emitting diode wafers, J ELEC MAT, 30(8), 2001, pp. 907-910
Citations number
11
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
JOURNAL OF ELECTRONIC MATERIALS
ISSN journal
03615235 → ACNP
Volume
30
Issue
8
Year of publication
2001
Pages
907 - 910
Database
ISI
SICI code
0361-5235(200108)30:8<907:WBO5MS>2.0.ZU;2-3
Abstract
The feasibility of bonding 50-mm-diameter Si with a Au/AuBe mirror to AlGaI nP light-emitting diode (LED) wafers is demonstrated. Wafer bonding over th e entire wafer area is achieved while the metallic mirror still maintains h igh reflectivity. Using this technique, the mirror-substrate AlGaInP LEDs a re fabricated across an entire 50-mm wafer. The test data show that 98% of the dice with operating voltages <2.2 V at 20 mA and 85% of the dice with l uminous intensity in the 130<similar to>140 mcd region. The wafer-bonded mi rror-substrate LED lamps operating at 626 nm can emit 3 lm at 20 mA with a forward voltage of 2 V, corresponding to a luminous efficiency of 74 lm/W. Moreover, they present a peak power efficiency of 21% with 4 mW output at 1 0 mA (1.9 V). Essentially no degradation is observed for these LEDs after 2 000 h stress at 80 degreesC and 50 mA (55.6 A/cm(2)). The results indicate the mirror-substrate AlGaInP LEDs of highly reliable and efficient performa nce.