Electron energy-loss near-edge structure - a tool for the investigation ofelectronic structure on the nanometre scale

Electron energy-loss near-edge structure (ELNES) is a technique that can be used to measure the electronic structure (i.e. bonding) in materials with subnanometre spatial resolution. This review covers the theoretical princip les behind the technique, the experimental procedures necessary to acquire good ELNES spectra, including potential artefacts, and gives examples relev ant to materials science.