High-voltage electron microscope high-temperature in situ straining experiments to study dislocation dynamics in intermetallics and quasicrystals

Citation
U. Messerschmidt, High-voltage electron microscope high-temperature in situ straining experiments to study dislocation dynamics in intermetallics and quasicrystals, J MICROSC O, 203, 2001, pp. 68-71
Citations number
16
Categorie Soggetti
Multidisciplinary
Journal title
JOURNAL OF MICROSCOPY-OXFORD
ISSN journal
00222720 → ACNP
Volume
203
Year of publication
2001
Part
1
Pages
68 - 71
Database
ISI
SICI code
0022-2720(200107)203:<68:HEMHIS>2.0.ZU;2-C
Abstract
The dynamic behaviour of dislocations in several intermetallic alloys, stud ied by in situ straining experiments in a high-voltage electron microscope, is compared at room temperature and at high temperatures. In contrast to r oom temperature, the dislocations move viscously at high temperatures. whic h is explained by diffusion processes in the dislocation cores. In quasicry stals, the viscous dislocation motion can be interpreted by models on the c luster scale.