Sintered BaTiO3, SrTiO3, and Pb(ZrTi1-x)O-3 ceramics were examined using or
ientation imaging microscopy (OIM (TM)), which is a system for the automate
d measurement of grain orientations by evaluating electron backscatter diff
raction patterns in scanning electron microscopy. As expected for sintered
materials, none of the three materials exhibited a pronounced texture. Howe
ver, analysis of the orientation relationships (ORs) between adjacent grain
s revealed a statistically significant preference of Sigma = 3 ORs. Accordi
ngly, the boundaries between grains with a Sigma = 3 OR were particularly i
mportant for the macroscopic properties of the materials in question.