The effect of various electrically conductive oxides on the morphology and
the electrical properties of SrTiO3 films (STO) was investigated by means o
f scanning electron microscopy, impedance analysis and leakage current meas
urement (DC). LaNiO3 (LNO), La0.5Sr0.5CoO3 (LSCO) and La0.7Sr0.3MnO3 (LSMO)
as electrically conductive oxides were deposited on platinized silicon waf
ers by chemical solution deposition (CSD) via the propionate route. Subsequ
ently a film of STO was deposited by CSD of an acetate based precursor solu
tion. Platinum contacts were sputtered onto the STO film to act as top elec
trodes. The STO films in these multilayer structures showed significant dif
ferences to STO films grown directly on the platinized substrate with respe
ct to morphology as well as to the electrical properties. (C) 2001 Elsevier
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