A fast resistance measurement system for impedance tomography using a bipolar DC pulse method

Citation
Jja. Van Weereld et al., A fast resistance measurement system for impedance tomography using a bipolar DC pulse method, MEAS SCI T, 12(8), 2001, pp. 1002-1011
Citations number
14
Categorie Soggetti
Spectroscopy /Instrumentation/Analytical Sciences","Instrumentation & Measurement
Journal title
MEASUREMENT SCIENCE & TECHNOLOGY
ISSN journal
09570233 → ACNP
Volume
12
Issue
8
Year of publication
2001
Pages
1002 - 1011
Database
ISI
SICI code
0957-0233(200108)12:8<1002:AFRMSF>2.0.ZU;2-1
Abstract
A bipolar pulse DC resistance measurement modified for use in electrical im pedance tomography is presented. The measurement method compensates for off set voltages. which usually exist between electrodes. The absence of phase shifts as encountered in AC systems using sinusoidal excitation greatly sim plifies the measurement. For low to medium resistivity of the subject the m ethod is faster than AC methods. Measurements on an equivalent four-termina l network show repeatabilities of approximately 0.01%. The method is applie d in a PC-controlled system with 192 electrodes to measure fluid distributi on in porous rock samples during petrophysical experiments. Repeatability o f acquired data sets is typically 4 to 5 LSB of a 16-bit A/D converter. com pared with 2 to 3 LSB obtained from a four-terminal network, and allows rel iable reconstruction.