A Dual Channel Injection Enhanced Gate Transistor (DC-IEGT) device structur
e which allows for an additional p-channel to collect holes during turn-off
is proposed and analysed in detail by extensive two-dimensional simulation
s. The DC-IEGT shows overall superior performance over the conventional IEG
T and IGBT and is characterised by low on-state voltage drop, fast switchin
g and large SOA. (C) 2001 Elsevier Science Ltd. All rights reserved.