Shadow moire profilometry by frequency sweeping

Citation
Lh. Jin et al., Shadow moire profilometry by frequency sweeping, OPT ENG, 40(7), 2001, pp. 1383-1386
Citations number
8
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Optics & Acoustics
Journal title
OPTICAL ENGINEERING
ISSN journal
00913286 → ACNP
Volume
40
Issue
7
Year of publication
2001
Pages
1383 - 1386
Database
ISI
SICI code
0091-3286(200107)40:7<1383:SMPBFS>2.0.ZU;2-A
Abstract
dA frequency-sweeping technique is proposed to measure the shape of objects with discontinuous height steps and/or spatially separated surfaces, which have been impossible to measure with conventional shadow moire topography. By controlling the rotation angle of the grating, spatiotemporal moire pat terns are produced with different contour intervals. The Fourier-transform technique has been applied to analyze these patterns and obtain the tempora l carrier frequency, to which the height distribution of the object is rela ted. Experimental results show the validity of this method. (C) 2001 Societ y of Photo-Optical Instrumentation Engineers.